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Research Article
A Innovative Method for Analysis of Faults Caused At Multiple Locations
Shahul Hameed Jamshak1
James Akash2
1,2Dept. of ECE, RAJADHANI INSTITUTE OF SCIENCE AND TECHNOLOGY, Kerala, India.
Published Online: March-April 2022
Pages: 09-10
Cite this article
No DOIReferences
[1] Xiaochun Yu and R. D. (Shawn) Blanton (2008), “Multiple Defect Diagnosis Using NoAssumptions on Failing PatternCharacteristics”,
DAC, California, pp.361-366.
[2] Rodríguez-Montañés. R, Arumí, D, Figueras S. Einchenberger, Hora. C, Kruseman .B(2010),“DiagnosisofFullOpenDefectsinInterconnect
Lines withFan-out”,IEEE,pp.233-238.
[3] Yung-ChiehLinandKwang-TingCheng(2006),“Multiple-FaultDiagnosisBasedonSingle-FaultActivationandSingle-OutputObservation”,EDAA.
[4] Yung-ChiehLin,FengLuandKwang-TingCheng(2007),“Multiple-
FaultDiagnosisBasedOnAdaptiveDiagnosticTestPatternGeneration”,IEEETransactions.
[5] Jing Ye,YuHu,XiaoweiLi,Wu-Tung Cheng,YuHuang andHuaxing Tang (2014),“Diagnose Failures Caused by Multiple Locations
ataTime”,IEEETransactions
DAC, California, pp.361-366.
[2] Rodríguez-Montañés. R, Arumí, D, Figueras S. Einchenberger, Hora. C, Kruseman .B(2010),“DiagnosisofFullOpenDefectsinInterconnect
Lines withFan-out”,IEEE,pp.233-238.
[3] Yung-ChiehLinandKwang-TingCheng(2006),“Multiple-FaultDiagnosisBasedonSingle-FaultActivationandSingle-OutputObservation”,EDAA.
[4] Yung-ChiehLin,FengLuandKwang-TingCheng(2007),“Multiple-
FaultDiagnosisBasedOnAdaptiveDiagnosticTestPatternGeneration”,IEEETransactions.
[5] Jing Ye,YuHu,XiaoweiLi,Wu-Tung Cheng,YuHuang andHuaxing Tang (2014),“Diagnose Failures Caused by Multiple Locations
ataTime”,IEEETransactions
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